Plasma charging damage /

Transient-induced latchup in CMOS integrated circuits /
by: Ker, Ming-Dou
Published: (2009)

Transient-induced latchup in CMOS integrated circuits /
by: Ker, Ming-Dou
Published: (2009)

Theory of plasmas /
Published: (1975)

Radiation defects in ion implanted and/or high-energy irradiated MOS structures /
by: Kaschieva, S., 1962-
Published: (2010)

Electron radiation damage in semiconductors and metals /
by: Corbett, James W.
Published: (1966)

Radiation damage and defects in semiconductors /
Published: (1973)

Defects and radiation effects in semiconductors, 1978 : invited and contributed papers from the International Conference on Defects and Radiation Effects in Semiconductors held in Nice, 11-14 September 1978 /
Published: (1979)

Radiation effects in semiconductors : [proceedings] /
Published: (1971)

Defects and radiation effects in semiconductors, 1980 : invited and contributed papers from the eleventh International Conference on Defects and Radiation Effects in Semiconductors held in Oiso, Japan, 8-11 September 1980 /
Published: (1981)

Ion implantation in semiconductors : science and technology : [proceedings of the fourth International Conference on Ion Implantation in Semiconductors and Other Materials, held at the Osaka Chamber of Commerce and Industry, August 1974] /
Published: (1975)

Charge-based MOS transistor modeling : the EKV model for low-power and RF IC design /
by: Enz, Christian
Published: (2006)

Charge-based MOS transistor modeling : the EKV model for low-power and RF IC design /
by: Enz, Christian
Published: (2006)

Radiation effects in semiconductor devices.
by: Larin, Frank
Published: (1968)

Hardening semiconductor components against radiation and temperature /
Published: (1989)

Mechanism of radiation effects in electronic materials /
Published: (1980)

Transistor level modeling for analog/RF IC design /
Published: (2006)

Defect oriented testing for CMOS analog and digital circuits /
by: Sachdev, Manoj
Published: (1998)

Reliability and radiation effects in compound semiconductors /
by: Johnston, Allan (Allan H.)
Published: (2010)

Proceedings /
Published: (1989)

Plasma etching processes for CMOS device realization /
Published: (2017)

Defects in microelectronic materials and devices /
Published: (2009)

Operation and modeling of the MOS transistor /
by: Tsividis, Yannis
Published: (1999)

Operation and modeling of the MOS transistor /
by: Tsividis, Yannis
Published: (2011)

Radiation effects in semiconductors /
Published: (2011)

Advanced MOS device physics /
Published: (1989)

Oxide reliability : a summary of silicon oxide wearout, breakdown, and reliability /
Published: (2002)

Semiconductor devices /
by: Kano, Kanaan
Published: (1998)

Defects and radiation damage in metals /
by: Thompson, M. W. (Michael Warwick)
Published: (1969)

Workshop record /

Workshop record /

Fundamentals of bias temperature instability in MOS transistors : characterization methods, process and materials impact, DC and AC modeling /
Published: (2016)

MOSFETs : properties, preparations and performance /
Published: (2008)

Power MOSFETS : theory and applications /
by: Grant, Duncan A. (Duncan Andrew)
Published: (1989)

Silicon RF power MOSFETS /
by: Baliga, B. Jayant, 1948-
Published: (2005)

Silicon RF power MOSFETS /
by: Baliga, B. Jayant, 1948-
Published: (2005)

Floating body cell : a novel capacitor-less DRAM cell /
by: Ohsawa, Takashi
Published: (2012)