In situ real time characterization of thin films : edited by Orlando Auciello, Alan R. Krauss.
| Other Authors: | , |
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| Format: | Book |
| Language: | English |
| Published: |
New York :
Wiley,
[2001]
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| Subjects: |
| Item Description: | "A Wiley-Interscience publication." |
|---|---|
| Physical Description: | xi, 263 pages : illustrations ; 25 cm. |
| Bibliography: | Includes bibliographical references and index. |
| ISBN: | 0471241415 (cloth : alk. paper) |