Cover Image

X-ray investigations of polymer structures II : 2-5 December 1999, Szczyrk, Poland /

Bibliographic Details
Corporate Authors: Politechnika Łódzka, European Polymer Federation, Komitet Badań Naukowych (Poland), Society of Photo-optical Instrumentation Engineers, Society of Photo-optical Instrumentation Engineers. Poland Chapter, Polska Akademia Nauk, International Conference on X-ray Investigations of Polymer Structures
Other Authors: Włochowicz, Andrzej
Format: Conference Proceeding Book
Language:English
Published: Bellingham, Wash., USA : SPIE, [2000]
Series:SPIE Poland Chapter proceedings ; 57.
Proceedings of SPIE--the International Society for Optical Engineering ; v. 4240.
Subjects:
Polymers > Radiography > Congresses.
Polymers > Structure > Congresses.
X-rays > Scattering > Congresses.
Description
Item Description:"Fourth international conference on X-ray Investigations of Polymer Structures (XIPS)"--P. vii.
Physical Description:x, 88 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0819439142