Cover Image

Scattering and surface roughness III : 1-2 August 2000, San Diego, USA /

Bibliographic Details
Corporate Author: Society of Photo-optical Instrumentation Engineers
Other Authors: Gu, Zu-Han, Maradudin, Alexei A., 1931-
Format: Book
Language:English
Published: Bellingham, Wash., USA : SPIE, [2000]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 4100.
Subjects:
Surface roughness > Measurement > Congresses.
Light > Scattering > Congresses.
Electromagnetic waves > Scattering > Congresses.
Description
Item Description:"31 July-2 August 2000"--Cover.
Physical Description:vii, 222 pages : illustrations (some color) ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:081943745X