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Optical systems contamination and degradation II : effects, measurements, and control : 2-3 August 2000, San Diego, USA /

Bibliographic Details
Corporate Author:	Society of Photo-optical Instrumentation Engineers
Other Authors:	Chen, Philip T., Uy, O. Manuel
Format:	Book
Language:	English
Published:	Bellingham, Wash., USA : SPIE, [2000]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 4096.
Subjects:	Space vehicles > Contamination > Congresses. Space stations > Contamination > Congresses. Space vehicles > Optical equipment > Congresses.

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