Cover Image

Optical systems contamination and degradation II : effects, measurements, and control : 2-3 August 2000, San Diego, USA /

Bibliographic Details
Corporate Author: Society of Photo-optical Instrumentation Engineers
Other Authors: Chen, Philip T., Uy, O. Manuel
Format: Book
Language:English
Published: Bellingham, Wash., USA : SPIE, [2000]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 4096.
Subjects:
Space vehicles > Contamination > Congresses.
Space stations > Contamination > Congresses.
Space vehicles > Optical equipment > Congresses.
Description
Physical Description:v, 204 pages : illustrations (some color) ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0819437417