Society of Photo-optical Instrumentation Engineers, Chen, P. T., & Uy, O. M. (2000). Optical systems contamination and degradation II: Effects, measurements, and control : 2-3 August 2000, San Diego, USA. SPIE.
Chicago Style (17th ed.) CitationSociety of Photo-optical Instrumentation Engineers, Philip T. Chen, and O. Manuel Uy. Optical Systems Contamination and Degradation II: Effects, Measurements, and Control : 2-3 August 2000, San Diego, USA. Bellingham, Wash., USA: SPIE, 2000.
MLA (9th ed.) CitationSociety of Photo-optical Instrumentation Engineers, et al. Optical Systems Contamination and Degradation II: Effects, Measurements, and Control : 2-3 August 2000, San Diego, USA. SPIE, 2000.
Warning: These citations may not always be 100% accurate.