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Proceedings /

Bibliographic Details
New Title:ROCS Workshop. Proceedings
Corporate Authors: GaAs Reliability Workshop, JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards, IEEE Electron Devices Society
Format: Conference Proceeding
Language:English
Published: Piscataway, NJ : IEEE, 1997?-2003.
Subjects:
Gallium arsenide semiconductors > Reliability > Congresses.
Description
Published:1997-2003.
Physical Description:7 volumes : illustrations ; 28 cm.
Also issued online.
Publication Frequency:Annual