Stanislas, M., Kompenhans, J., & Westerweel, J. (2000). Particle image velocimetry: Progress towards industrial application. Kluwer Academic Publishers.
Chicago Style (17th ed.) CitationStanislas, M., Jürgen Kompenhans, and J. Westerweel. Particle Image Velocimetry: Progress Towards Industrial Application. Dordrecht ; Boston: Kluwer Academic Publishers, 2000.
MLA (9th ed.) CitationStanislas, M., et al. Particle Image Velocimetry: Progress Towards Industrial Application. Kluwer Academic Publishers, 2000.
Warning: These citations may not always be 100% accurate.