Laser interferometry X : applications : 2-3 August 2000, San Diego, [California] USA /

Bibliographic Details
Corporate Author: Society of Photo-optical Instrumentation Engineers
Other Authors: Pryputniewicz, Ryszard J., Brown, Gordon M., Jüptner, Werner P. O.
Format: Book
Language:English
Published: Bellingham, Washington : SPIE, [2000]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 4101.
Subjects:
Description
Physical Description:xi, 291-602 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0819437468