Technologies for synthetic environments : hardware-in-the-loop testing V : 24-26 April 2000, Orlando, [Florida] USA /

Bibliographic Details
Corporate Author: Society of Photo-optical Instrumentation Engineers
Other Authors: Murrer, Robert Lee, Jr
Format: Book
Language:English
Published: Bellingham, Washington : SPIE, [2000]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 4027.
Subjects:
Online Access:https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/4027.toc
Description
Physical Description:ix, 410 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0819436534