X-ray optics, instruments, and missions III : 27-29 March 2000, Munich, Germany /
| Corporate Authors: | , , |
|---|---|
| Other Authors: | , |
| Format: | Book |
| Language: | English |
| Published: |
Bellingham, Wash. :
SPIE,
[2000]
|
| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 4012. |
| Subjects: |
| Physical Description: | xiii, 746 pages : illustrations (some color) ; 28 cm. |
|---|---|
| Bibliography: | Includes bibliographical references and index. |
| ISBN: | 0819436372 |