Infrared characterization for microelectronics /

Bibliographic Details
Main Author:	Lau, W. S.
Format:	Book
Language:	English
Published:	Singapore ; River Edge, NJ : World Scientific, [1999]
Subjects:	Microelectronics > Materials > Testing. Infrared spectroscopy. Absorption spectra.

Description
Physical Description:	x, 160 pages : illustrations ; 23 cm.
Bibliography:	Includes bibliographical references and index.
ISBN:	9810223528