Lau, W. S. (1999). Infrared characterization for microelectronics. World Scientific.
Chicago Style (17th ed.) CitationLau, W. S. Infrared Characterization for Microelectronics. Singapore ; River Edge, NJ: World Scientific, 1999.
MLA (9th ed.) CitationLau, W. S. Infrared Characterization for Microelectronics. World Scientific, 1999.
Warning: These citations may not always be 100% accurate.