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Atom probe tomography : analysis at the atomic level /

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Bibliographic Details
Main Author: Miller, M. K. (Michael Kenneth)
Format: Book
Language:English
Published: New York : Kluwer Academic / Plenum Publishers, 2000.
Subjects:
Atom-probe field ion microscopy.
Tomography.
Description
Physical Description:xiv, 239 pages : illustrations ; 26 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0306464152