Project portfolio.

Bibliographic Details
Corporate Authors:	National Semiconductor Metrology Program (U.S.), National Institute of Standards and Technology (U.S.). Office of Microelectronics Programs
Format:	Government Document Microform Serial
Language:	English
Published:	Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1996-
Series:	NISTIR.
Subjects:	National Semiconductor Metrology Program (U.S.) > Periodicals. Semiconductors > Measurement > Periodicals.
Online Access:	https://purl.fdlp.gov/GPO/LPS4434

Description
Published:	Fiscal year 1996-
Item Description:	Paper copies available from: Office of Microelectronics Programs, National Institute of Standards and Technology, Building 225, Room A317, Mail Stop 8101, Gaithersburg, MD 20899-8101. Microform.
Physical Description:	volumes ; 28 cm. Also available via the Internet at the National Semiconductor Metrology Program web site. Address as of: 05/03/00: http://www.eeel.nist.gov/omp/table.htm; current access is available via PURL.
Publication Frequency:	Annual