APA (7th ed.) Citation

National Semiconductor Metrology Program (U.S.) & National Institute of Standards and Technology (U.S.). Office of Microelectronics Programs. (1996). Project portfolio. U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology.

Chicago Style (17th ed.) Citation

National Semiconductor Metrology Program (U.S.) and National Institute of Standards and Technology (U.S.). Office of Microelectronics Programs. Project Portfolio. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1996.

MLA (9th ed.) Citation

National Semiconductor Metrology Program (U.S.) and National Institute of Standards and Technology (U.S.). Office of Microelectronics Programs. Project Portfolio. U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1996.