Cover Image

Optical microstructural characterization of semiconductors : symposium held November 29-30, 1999, Boston, Massachusetts, U.S.A. /

Bibliographic Details
Other Authors: Ünlü, M. Selim
Format: Book
Language:English
Published: Warrendale, Pa. : Materials Research Society, [2000]
Series:Materials Research Society symposia proceedings ; v. 588.
Subjects:
Semiconductors > Congresses.
Microstructure > Congresses.
Description
Physical Description:xi, 333 pages : illustrations ; 24 cm.
Bibliography:Includes bibliographical references and indexes.
ISBN:1558994963
ISSN:0272-9172 ;