Ionizing radiation effects in MOS oxides /

Bibliographic Details
Main Author:	Oldham, Timothy R., 1947-
Format:	Book
Language:	English
Published:	Singapore ; River Edge, NJ : World Scientific, [1999]
Series:	International series on advances in solid state electronics and technology.
Subjects:	Metal oxide semiconductors > Effect of radiation on. Semiconductors > Effects of radiation. METAL OXIDE SEMICONDUCTORS. Semiconductor devices. Ionizing radiation. Radiation effects.

Description
Physical Description:	xiv, 171 pages : illustrations ; 23 cm.
Bibliography:	Includes bibliographical references.
ISBN:	9810233264