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Sixteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium : March 21-23, 2000, DoubleTree Hotel, San Jose, CA USA /

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Bibliographic Details
Corporate Authors: IEEE Semiconductor Thermal Measurement and Management Symposium San Jose, Calif., IEEE Components, Hybrids, and Manufacturing Technology Society
Format: Conference Proceeding Book
Language:English
Published: Piscataway, New Jersey : IEEE, [2000]
Subjects:
Semiconductors > Thermal properties > Congresses.
Semiconductors > Cooling > Congresses.
Description
Item Description:"IEEE catalog number 00CH37068"--Title page verso.
Physical Description:xi, 298 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references.
ISBN:078035916X (softbound)
0780359178 (casebound)
0780359186 (microfiche)