Cover Image

Defect and microstructure analysis by diffraction /

Bibliographic Details
Main Author: Snyder, R. L. (Robert L.), 1941-
Other Authors: Fiala, Jaroslav, Bunge, H.-J. (Hans Joachim)
Format: Book
Language:English
Published: [Chester, England] : Oxford ; New York : International Union of Crystallography ; Oxford University Press, 1999.
Series:International Union of Crystallography monographs on crystallography ; 10.
Subjects:
Crystals > Defects > Analysis.
Diffraction.
X-ray crystallography.
Description
Physical Description:xxii, 785 pages : illustrations ; 24 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0198501897