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Maximizing non-target defect detection using conventional stuck-at fault-based automated test pattern generation tools /

Testing plays a vital role in determining the success or failure of today's competitive integrated circuit manufacturing business. The cost of test generation, the quality of the applied tests, and the cost of applying the test determine if a product can be profitable in today's marketplac...

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Bibliographic Details
Main Author: Grimaila, Michael Russell, 1965-
Format: Thesis Book
Language:English
Published: [Place of publication not identified] : [publisher not identified] ; 1999.
Subjects:
Major electrical engineering.
Online Access:http://proxy.library.tamu.edu/login?url=http://proquest.umi.com/pqdweb?did=730316931&sid=1&Fmt=2&clientId=2945&RQT=309&VName=PQD

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