Small fatigue cracks : mechanics, mechanisms, and applications : proceedings of the Third Engineering Foundation International Conference, Turtle Bay Hilton, Oahu, Hawaii, December 6-11, 1998 /

Bibliographic Details
Corporate Author: Engineering Foundation (U.S.). International Conference
Other Authors: Ravichandran, K. S., Ritchie, R. O. (Robert O.), Murakami, Y. (Yukitaka), 1943-
Format: Book
Language:English
Published: Amsterdam ; New York : Elsevier, 1999.
Edition:1st ed.
Subjects:
Description
Physical Description:xii, 498 pages : illustrations ; 25 cm.
Bibliography:Includes bibliographical references and indexes.
ISBN:0080430112 (hc.)