Cover Image

Three-dimensional imaging, optical metrology, and inspection V : 19-20 September 1999, Boston, Massachusetts /

Bibliographic Details
Corporate Author: Society of Photo-optical Instrumentation Engineers
Other Authors: Harding, Kevin G.
Format: Book
Language:English
Published: Bellingham, Wash., USA : SPIE, [1999]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 3835.
Subjects:
Three-dimensional display systems > Congresses.
Lasers > Congresses.
Measurement > Congresses.
Triangulation > Congresses.
Engineering inspection > Congresses.
Description
Physical Description:ix, 224 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0819434280