Cover Image

Recent advances in metrology, characterization, and standards for optical digital data disks : 21-22 July 1999, Denver, Colorado /

Bibliographic Details
Corporate Authors: Society of Photo-optical Instrumentation Engineers, International Disk Drive Equipment and Materials Association, Information Technology Laboratory (National Institute of Standards and Technology)
Other Authors: Podio, Fernando L.
Format: Book
Language:English
Published: Bellingham, Wash., USA : SPIE, [1999]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 3806.
Subjects:
Optical storage devices > Testing > Congresses.
Optical disks > Standards > Congresses.
Optical disks > Testing > Congresses.
Description
Physical Description:v, 182 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:081943292X