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IC performance prediction for test cost reduction /

In today's competitive semiconductor manufacturing industry, it is very important to reduce cost and time-to-market and increase product yield with effective process control. After fabrication, integrated circuits (ICs) are tested while still in wafer form, and then again after they have been p...

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Bibliographic Details
Main Author: Lee, Jung Ran
Format: Thesis Book
Language:English
Published: [Place of publication not identified] : [publisher not identified] ; 1999.
Subjects:
Major computer science.
Online Access:http://proxy.library.tamu.edu/login?url=http://proquest.umi.com/pqdweb?did=733668191&sid=1&Fmt=2&clientId=2945&RQT=309&VName=PQD

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