Pattern recognition, chemometrics, and imaging for optical environmental monitoring : 20-21 September 1999, Boston, Massachusetts /
| Corporate Authors: | , |
|---|---|
| Other Authors: | , |
| Format: | Book |
| Language: | English |
| Published: |
Bellingham, Washington :
SPIE,
[1999]
|
| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
3854. |
| Subjects: |
| Physical Description: | viii, 142 pages : illustrations ; 28 cm. |
|---|---|
| Bibliography: | Includes bibliographical references and index. |
| ISBN: | 0819434477 |