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Failure analysis of integrated circuits : tools and techniques /

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Bibliographic Details
Other Authors: Wagner, Lawrence C.
Format: Book
Language:English
Published: Boston, Mass. : Kluwer Academic Publishers, [1999]
Subjects:
Semiconductors > Failures.
Integrated circuits > Testing.
Integrated circuits > Reliability.
Description
Item Description:"SECS 494"--P. [4] of cover.
Physical Description:ix, 255 pages : illustrations ; 25 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0412145618 (acid-free paper)