Cover Image

Materials reliability in microelectronics IX : symposium held April 6-8, 1999, San Francisco, California, U.S.A. /

Bibliographic Details
Other Authors: Volkert, Cynthia A., Verbruggen, Ad H., Brown, Dirk D.
Format: Book
Language:English
Published: Warrendale, Pennsylvania : Materials Research Society, [1999]
Series:Materials Research Society symposia proceedings ; v. 563.
Subjects:
Microelectronics > Reliability > Congresses.
Microelectronics > Materials > Testing > Congresses.
Microstructure > Congresses.
Metallizing > Congresses.
Description
Physical Description:ix, 311 pages : illustrations ; 24 cm.
Bibliography:Includes bibliographical references and indexes.
ISBN:155899470X