APA (7th ed.) Citation

European Optical Society, Society of Photo-optical Instrumentation Engineers, European Commission. Directorate-General XII, Science, Research, and Development, Scottish Enterprise, Sira Technology Centre (U.K.), Institution of Electrical Engineers, & Amberiadis, K. (1999). In-line characterization, yield reliability, and failure analysis in microelectronics manufacturing: 19-21 May, 1999, Edinburgh, Scotland. SPIE.

Chicago Style (17th ed.) Citation

European Optical Society, Society of Photo-optical Instrumentation Engineers, Science European Commission. Directorate-General XII, Scottish Enterprise, Sira Technology Centre (U.K.), Institution of Electrical Engineers, and Kostas Amberiadis. In-line Characterization, Yield Reliability, and Failure Analysis in Microelectronics Manufacturing: 19-21 May, 1999, Edinburgh, Scotland. Bellingham, Wash., USA: SPIE, 1999.

MLA (9th ed.) Citation

European Optical Society, et al. In-line Characterization, Yield Reliability, and Failure Analysis in Microelectronics Manufacturing: 19-21 May, 1999, Edinburgh, Scotland. SPIE, 1999.