Ultrafast phenomena in semiconductors III : 27-29 January 1999, San Jose, California /

Bibliographic Details
Corporate Authors: Society of Photo-optical Instrumentation Engineers, United States. Defense Advanced Research Projects Agency
Other Authors: Tsen, Kong Thon
Format: Book
Language:English
Published: Bellingham, Washington : SPIE, [1999]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 3624.
Subjects:
Online Access:https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/3624.toc
Description
Physical Description:vii, 298 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0819430943