Cover Image

Technologies for synthetic environments : hardware-in-the-loop testing IV : 5-7 April 1999, Orlando, Florida /

Bibliographic Details
Corporate Author: Society of Photo-optical Instrumentation Engineers
Other Authors: Murrer, Robert Lee, Jr
Format: Book
Language:English
Published: Bellingham, Washington : SPIE, [1999]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 3697.
Subjects:
Guided missiles > Testing > Congresses.
Infrared detectors > Congresses.
Guidance systems (Flight) > Congresses.
Online Access:https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/3697.toc
Description
Physical Description:x, 484 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0819431710