Evaluation, selection and generation of Iddq tests /

Bibliographic Details
Main Author:	Thadikaran, Paul J.
Format:	Thesis Book
Language:	English
Published:	[Place of publication not identified] : [publisher not identified] ; 1996.
Subjects:	Iddq testing. Integrated circuits > Very large scale integration > Testing. Integrated circuits > Testing.

Description
Physical Description:	vi, 124 leaves : illustrations ; 29 cm.
Bibliography:	Includes bibliographical references (leaves 115-124).