Test generation and evaluation for bridging faults in CMOS VLSI circuits /

Bibliographic Details
Main Author:	Lee, Terry Ping-Chung, 1968-
Format:	Thesis Book
Language:	English
Published:	[Place of publication not identified] : [publisher not identified] ; 1995.
Subjects:	Integrated circuits > Very large scale integration > Testing. Metal oxide semiconductors, Complementary > Testing.

Description
Item Description:	Vita.
Physical Description:	viii, 98 leaves : illustrations
Bibliography:	Includes bibliographical references (leaves 94-97).