Cover Image

Reliability and degradation of III-V optical devices /

Bibliographic Details
Main Author: Ueda, Osamu
Format: Book
Language:English
Published: Boston : Artech House, [1996]
Series:Artech House optoelectronics library.
Subjects:
Gallium arsenide semiconductors > Reliability.
Semiconductors > Failures.
Light emitting diodes > Reliability.
Crystals > Defects.
Description
Physical Description:xii, 353 pages : illustrations ; 24 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0890066523 (alk. paper)