Cover Image

Testing, packaging, reliability, and applications of semiconductor lasers IV : 28 January 1999, San Jose, California /

Bibliographic Details
Corporate Authors: Society of Photo-optical Instrumentation Engineers, United States. Defense Advanced Research Projects Agency
Other Authors: Fallahi, Mahmoud, Linden, Kurt J., Wang, S. C. (Shing Chung), 1934-
Format: Book
Language:English
Published: Bellingham, Wash., USA : SPIE, [1999]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 3626.
Subjects:
Semiconductor lasers > Testing > Congresses.
Semiconductor lasers > Reliability > Congresses.
Diodes, Semiconductor > Congresses.
Description
Physical Description:viii, 262 pages : illustrations (some color) ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:081943096X