Properties of amorphous silicon and its alloys /

Bibliographic Details
Corporate Authors:	Institution of Electrical Engineers, INSPEC. EMIS Group
Other Authors:	Searle, Tim, Dr
Format:	Book
Language:	English
Published:	London : INSPEC, [1998]
Series:	EMIS datareviews series ; no. 19.
Subjects:	Silicon. Silicon alloys. Amorphous semiconductors.

Published 1998

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