Society of Photo-optical Instrumentation Engineers & Stover, J. C. (1999). Surface characterization for computer disks, wafers, and flat panel displays: 28 January 1999, San Jose, California. SPIE.
Chicago Style (17th ed.) CitationSociety of Photo-optical Instrumentation Engineers and John C. Stover. Surface Characterization for Computer Disks, Wafers, and Flat Panel Displays: 28 January 1999, San Jose, California. Bellingham, Wash., USA: SPIE, 1999.
MLA (9th ed.) CitationSociety of Photo-optical Instrumentation Engineers and John C. Stover. Surface Characterization for Computer Disks, Wafers, and Flat Panel Displays: 28 January 1999, San Jose, California. SPIE, 1999.
Warning: These citations may not always be 100% accurate.