http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
Dielectric constant measurement of thermoelectric skutterudite materials
An attempt has been made to measure the low frequency dielectric constant of skutterudite materials. These semiconductor materials are being researched for thermoelectric applications. The experiment involved the fabrication of Schottky diodes on skutterudites with various atomic compositions. This technique was employed in order to determine how the dielectric constant varied with the atomic composition. The measurement of the depletion capacitance of these Schottky diodes was attempted, in order to determine the dielectric constant for various measurement signal frequencies. However, because of the high carrier concentrations of these semiconductor materials, the depletion capacitance values were not measurable by the setup, and the experiment failed to yield any useful measurement data.
"Major subject: Electrical Engineering".
Issued also on microfiche from Lange Micrographics.
Includes bibliographical references: pages 64-65.