rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Dielectric constant measurement of thermoelectric skutterudite materials
  name:
    name part: Stoller, David Lewin
    name part: 1973-
    role:
      role term: creator
  type of resource: text
  genre: bibliography
  origin info:
    place:
      place term: xx
    date issued: 1998
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: print
    extent: ix, 66 leaves : illustrations ; 28 cm.
  abstract: An attempt has been made to measure the low frequency dielectric constant of skutterudite materials. These semiconductor materials are being researched for thermoelectric applications. The experiment involved the fabrication of Schottky diodes on skutterudites with various atomic compositions. This technique was employed in order to determine how the dielectric constant varied with the atomic composition. The measurement of the depletion capacitance of these Schottky diodes was attempted, in order to determine the dielectric constant for various measurement signal frequencies. However, because of the high carrier concentrations of these semiconductor materials, the depletion capacitance values were not measurable by the setup, and the experiment failed to yield any useful measurement data.
  note: by David Lewin Stoller.
  note: "Major subject: Electrical Engineering".
  note: Vita.
  note: Issued also on microfiche from Lange Micrographics.
  note: M.S. Texas A&M University 1998.
  note: Includes bibliographical references: pages 64-65.
  subject:
    topic: Major electrical engineering
  record info:
    record content source: TXA
    record creation date: 990323
    record change date: 20151021055427.0
    record identifier: in00001473706