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Beam effects, surface topography, and depth profiling in surface analysis /

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Bibliographic Details
Other Authors: Czanderna, Alvin Warren, 1930-, Madey, Theodore E., Powell, C. J. (Cedric John)
Format: Book
Language:English
Published: New York : Plenum Press, [1998]
Series:Methods of surface characterization ; v. 5.
Subjects:
Surfaces (Technology) > Analysis.
Materials > Effect of radiation on.
Description
Physical Description:xix, 430 pages : illustrations ; 24 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0306458969