Cover Image

X-ray and ultraviolet spectroscopy and polarimetry II : 23-24 July 1998, San Diego, California /

Bibliographic Details
Corporate Author: Society of Photo-optical Instrumentation Engineers
Other Authors: Fineschi, Silvano
Format: Book
Language:English
Published: Bellingham, Washington : SPIE, [1998]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 3443.
Subjects:
Polarimetry > Congresses.
X-ray astronomy > Instruments > Congresses.
Ultraviolet astronomy > Instruments > Congresses.
Online Access:https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/3443.toc
Description
Physical Description:v, 160 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0819428981