rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Materials reliability in microelectronics VIII
    sub title: symposium held April 13-16, 1998, San Francisco, California, U.S.A
  title info:
    title: Materials reliability in microelectronics eight
  title info:
    title: Materials reliability in microelectronics 8
  name:
    name part: Bravman, J. C. (John C.)
  type of resource: text
  genre: bibliography
  genre: conference publication
  origin info:
    place:
      place term: pau
    date issued: 1998
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: print
    extent: xi, 365 pages : illustrations ; 24 cm.
  note: editors, John C. Bravman [and others].
  note: Includes bibliographical references and indexes.
  subject:
    topic: Microelectronics
    topic: Reliability
    topic: Congresses
  subject:
    topic: Microelectronics
    topic: Materials
    topic: Testing
    topic: Congresses
  subject:
    topic: Microstructure
    genre: Congresses
  subject:
    topic: Metallizing
    genre: Congresses
  related item:
    title info:
      title: Materials Research Society symposia proceedings ; v. 516
  identifier: 155899422X
  record info:
    record content source: LHL
    record creation date: 981203
    record change date: 20151021053508.0
    record identifier: in00001466089