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Fundamentals of modern VLSI devices /

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Bibliographic Details
Main Author: Taur, Yuan, 1946-
Other Authors: Ning, Tak H., 1943-
Format: Book
Language:English
Published: Cambrige, UK ; New York : Cambridge University Press, 1998.
Subjects:
Metal oxide semiconductors, Complementary.
Bipolar transistors.
Integrated circuits > Very large scale integration.
Description
Physical Description:xxii, 469 pages : illustrations ; 26 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0521550564
0521559596 (pbk.)