Guidebook for managing silicon chip reliability /

Reliability of electronic packages and semiconductor devices /
by: Di Giacomo, Giulio
Published: (1997)

Reliability of RoHS-Compliant 2D and 3D IC interconnects /
by: Lau, John H.
Published: (2011)

International Integrated Reliability Workshop final report.

Hot-carrier reliability of MOS VLSI circuits /
by: Leblebici, Yusuf
Published: (1993)

Reliability physics 1980 : 18th annual proceedings, Las Vegas, Nevada, April 8-10, 1980 /
Published: (1980)

Reliability, yield, and stress burn-in : a unified approach for microelectronics systems manufacturing & software development /
by: Kuo, Way, 1951-
Published: (1998)

Silicon materials--processing, characterization and reliability : symposium held April 1-5, 2002, San Francisco, California, U.S.A. /
Published: (2002)

Hybrid microcircuit reliability data /
Published: (1976)

Integrating reliability into microelectronics manufacturing /
by: Christou, A.
Published: (1994)

Failure-free integrated circuit packages : systematic elimination of failures through reliability engineering, failure analysis, and material improvements /
Published: (2004)

Microelectronics manufacturing, yield, and reliability : 20-21 October 1994, Austin, Texas /
Published: (1994)

VLSI reliability /
by: Sabnis, Anant G.
Published: (1990)

Electronics reliability and measurement technology : nondestructive evaluation /
Published: (1988)

Rapid reliability assessment of VLSICs /
Published: (1990)

Electronic packaging for high reliability; low cost electronics /
Published: (1999)

Reliability physics.
Published: (1993)

Failure analysis of integrated circuits : tools and techniques /
Published: (1999)

IEEE International Integrated Reliability Workshop final report /

IEEE international reliability physics proceedings /
Published: (1994)

Electronic packaging reliability : presented at the 1993 ASME Winter Annual Meeting, New Orleans, Louisiana, November 28-December 3, 1993 /
Published: (1993)

IEEE International Reliability Physics Symposium proceedings /
Published: (1997)

Integrated circuit quality and reliability /
by: Hnatek, Eugene R.
Published: (1995)

Yield and variability optimization of integrated circuits /
by: Zhang, J. C., 1963-
Published: (1995)

Proceedings of the ... European Symposium on Reliability of Electron Devices, Failure Physics and Analyses.

Electronics reliability and measurement technology : nondestructive evaluation /
Published: (1988)

Statistical performance modeling and optimization /
by: Li, Xin
Published: (2007)

Reliability and degradation : semiconductor devices and circuits /
Published: (1981)

Oxide reliability : a summary of silicon oxide wearout, breakdown, and reliability /
Published: (2002)

Reliability prediction for microelectronics /
by: Bernstein, Joseph B., et al.
Published: (2024)

Metallization : performance and reliability issues for VLSI and ULSI : 12-13 September 1991, San Jose, California /
Published: (1991)

Reliability and degradation of semiconductor lasers and LEDs /
by: Fukuda, Mitsuo
Published: (1991)

Fundamentals of reliability engineering : applications in multistage interconnection networks /
by: Gunawan, Indra
Published: (2014)

Reliability-yield allocation for semiconductor integrated circuits : modeling and optimization /
by: Ha, Chunghun, 1969-
Published: (2005)

Components quality/reliability handbook.
Published: (1989)

Silicon VLSI technology : fundamentals, practice and modeling /
by: Plummer, James D.
Published: (2000)

Performance and reliability of a 1-kW amorphous silicon photovoltaic roofing system /
by: Adelstein, J.
Published: (2005)