Technologies for synthetic environments : hardware-in-the-loop testing III : 13-15 April 1998, Orlando, Florida /

Bibliographic Details
Corporate Author:	Society of Photo-optical Instrumentation Engineers
Other Authors:	Murrer, Robert Lee, Jr
Format:	Book
Language:	English
Published:	Bellingham, Wash., USA : SPIE, [1998]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 3368.
Subjects:	Guided missiles > Testing > Congresses. Infrared detectors > Congresses. Guidance systems (Flight) > Congresses.
Online Access:	https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/3368.toc

Description
Physical Description:	ix, 444 pages : illustrations ; 28 cm.
Bibliography:	Includes bibliographical references and index.
ISBN:	0819428175