rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Scientific detection of fakery in art
    sub title: 29-30 January 1998, San Jose, California
  name:
    name part: McCrone, Walter C.
  name:
    name part: Chartier, Duane R.
  name:
    name part: Weiss, Richard J. (Richard Jerome)
    name part: 1923-
  name:
    name part: Society of Photo-optical Instrumentation Engineers
  name:
    name part: IS & T--the Society for Imaging Science and Technology
  type of resource: text
  genre: conference publication
  origin info:
    place:
      place term: wau
    date issued: 1998
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: print
    extent: v, 106 pages : illustrations ; 28 cm.
  note: Walter McCrone, Duane R. Chartier, Richard J Weiss, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering.
  note: Includes bibliographical references and index.
  subject:
    topic: Art
    topic: Radiography
    topic: Congresses
  subject:
    topic: Art
    topic: Forgeries
    topic: Congresses
  subject:
    topic: Art
    topic: Expertising
    topic: Congresses
  subject:
    topic: Painting
    topic: Expertising
    topic: Congresses
  subject:
    topic: Expertising, X-ray
    topic: Congresses
  subject:
    topic: Science and the arts
    topic: Congresses
  related item:
    title info:
      title: Proceedings of SPIE--the International Society for Optical Engineering ; v. 3315
  identifier: 0819427551
  identifier: https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/3315.toc
  related item:
    location:
      url: https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/3315.toc
  record info:
    record content source: CUS
    record creation date: 980612
    record change date: 20230522160728.3
    record identifier: in00001427093