New signal processing algorithm for white light interferometry /

A new signal processing algorithm for white light

Bibliographic Details
Main Author: Kim, Jeong Gon, 1959-
Format: Thesis Book
Language:English
Published: [Place of publication not identified] : [publisher not identified] ; 1997.
Subjects:
Online Access:http://proxy.library.tamu.edu/login?url=http://proquest.umi.com/pqdweb?did=736580351&sid=1&Fmt=2&clientId=2945&RQT=309&VName=PQD
Description
Summary:A new signal processing algorithm for white light
interferometry has been proposed and investigated
theoretically and experimentally. The goal of the algorithm
is to determine the absolute length of an interferometer with
very high precision (<< one optical wavelength). The
algorithm features cross-correlation of interferometer
fringe, patterns and hypothesis testing. The key to making
the signal processing algorithm work efficiently is that all
photons in a fringe scan are fully utilized through the
cross-correlation of fringes and matched filtering. The
hypothesis test looks for a zero order fringe peak candidate
about which the cross-correlation is symmetric minimizing the
uncertainty of misidentification. The shot noise limited
performance of the proposed signal processing algorithm has
been analyzed using Monte-Carlo simulation. Simulation
results were extrapolated to predict the misidentification
rate at Signal-to-Shot noise ratio higher than 31 dB. Root-
mean-square phase error between the computer-generated zero
order fringe peak and the estimated zero order fringe peak
has been calculated for various parameter changes. Results of
simulation and comparison with experimental data showed the
ability of the proposed signal processing algorithm to
identify the zero order fringe peak correctly and the
proposed signal processing algorithm proved to be a good
diagnostic tool to show the quality of the white light
interferometry fringe scan. The proposed signal processing
algorithm uses a software approach which is potentially
inexpensive, simple and fast.
Item Description:Vita.
"Major Subject: Electrical Engineering".
Physical Description:xiv, 177 leaves : illustrations ; 28 cm.
Issued also on microfiche from University Microfilms Inc.
Bibliography:Includes bibliographical references: pages 169-172.