Proceedings : International Test Conference 1997.

Bibliographic Details
Corporate Authors:	International Test Conference Washington, D.C., IEEE Computer Society. Test Technology Technical Committee, Institute of Electrical and Electronics Engineers. Philadelphia Section
Format:	Conference Proceeding Book
Language:	English
Published:	Washington, D.C. : The Conference, ©1997.
Subjects:	Integrated circuits > Testing > Congresses. Electronic digital computers > Circuits > Testing > Congresses. Electronic digital computers > Circuits > Testing. Integrated circuits > Testing. Circuits intégrés > Essais > Congrès. Conference papers and proceedings.
Online Access:	IEEE Xplore IEEE Xplore

Description
Item Description:	"Sponsored by IEEE Computer Society, Test Technology Technical Committee and IEEE Philadelphia Section"--Cover. "November 1-6, 1997 ... Washington, D.C., USA"--Cover. "IEEE catalog number 97CH36126"--Title page verso.
Physical Description:	xiv, 1054 pages : illustrations ; 28 cm Also available via the World Wide Web with additional title: Test Conference, 1997, proceedings, International.
Bibliography:	Includes bibliographical references and index.
ISBN:	0780342100 9780780342101 0780342097 9780780342095 0780342119 9780780342118 0780342127 9780780342125