APA (7th ed.) Citation

International Test Conference Washington, D.C., IEEE Computer Society. Test Technology Technical Committee, & Institute of Electrical and Electronics Engineers. Philadelphia Section. (1997). Proceedings: International Test Conference 1997. The Conference.

Chicago Style (17th ed.) Citation

International Test Conference Washington, D.C., IEEE Computer Society. Test Technology Technical Committee, and Institute of Electrical and Electronics Engineers. Philadelphia Section. Proceedings: International Test Conference 1997. Washington, D.C.: The Conference, 1997.

MLA (9th ed.) Citation

International Test Conference Washington, D.C., et al. Proceedings: International Test Conference 1997. The Conference, 1997.