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Reliability, yield, and stress burn-in : a unified approach for microelectronics systems manufacturing & software development /

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Bibliographic Details
Main Author: Kuo, Way, 1951-
Other Authors: Chien, Wei-Ting Kary, 1965-, Kim, Taeho, 1960-
Format: Book
Language:English
Published: Boston : Kluwer Academic, [1998]
Subjects:
Integrated circuits > Design and construction > Reliability.
Microelectronics > Reliability.
Computer software > Development > Reliability.
Semiconductors > Computer programs > Reliability.
Description
Physical Description:xxvi, 394 pages : illustrations ; 25 cm.
Bibliography:Includes bibliographical references (pages [333]-361) and index.
ISBN:0792381076 (alk. paper)